Rearick 2018 IEEE-CS Karlsson Award

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LOS ALAMITOS, 19 April 2018 – Jeff Rearick, Senior Fellow at Advanced Micro Devices, is named recipient of the 2018 IEEE Computer Society Hans Karlsson Award. Rearick is being recognized “for his vision, extraordinary skills and dedication in leading, shaping, and promoting the IEEE 1687 standard that provides access to embedded semiconductor instrumentation.”

At Advanced Micro Devices, (AMD) Rearick and his team are responsible for the Design-For-Testability strategy and roadmap for the company.  In his 12 years at AMD and in the 22 previous years at HP/Agilent, he has worked on many aspects of integrated circuit testing, from hands-on testing of microprocessors to test automation tools to DFT architecture. His work includes the design and use of on-chip instruments for testing complex digital functions and analog/mixed-signal circuits such as high-speed I/Os and delay-locked loops.

Rearick extended his embedded test work by co-founding the IEEE SA IJTAG (Internal Joint Test Action Group), whose efforts became standardized in 2014 as IEEE 1687 (Access and Control of Instrumentation Embedded within a Semiconductor Device), for which he served as the Editor.  In recognition of the impact of that work, Rearick received the 2016 Bob Madge Innovation Award at the International Test Conference.  He built on that momentum by co-founding three currently active working groups: IEEE P1687.1 for the re-use of functional interfaces and controllers to access 1687 networks, IEEE P1687.2 for describing analog test access and control (for which he is again serving as Editor), and IEEE P2427 for analog defect coverage measurement.

Rearick received a Special Recognition Award for his efforts in the development and first silicon demonstration of IEEE 1149.6 (AC Boundary Scan) and a Certificate of Appreciation for his role in IEEE 1804 (Fault Coverage and Accounting).  He is a longstanding member of the IEEE Test Technology Standards Committee.

In addition to his standards work, Rearick has served on the Program Committee of the International Test Conference for 10 years and has contributed to the Program Committee of the European Test Symposium.

Holding over 40 U.S. patents, Rearick has presented dozens of technical papers, invited addresses, and keynotes at various conferences.

Rearick earned BSEE and MSEE degrees from Purdue University and the University of Illinois, respectively.

The award consists of a plaque and a $2000 honorarium, and is annually given to the most outstanding team leader in the field of computer engineering standards, and recognizes outstanding skills and dedication in diplomacy, team facilitation and joint achievement in the areas where individual aspirations, corporate competition and organization rivalry would otherwise be counter to the common good.

The award will be presented at the IEEE Computer Society’s annual awards ceremony to be held on 6 June 2018 in Phoenix, Arizona.